Yu-Xi Sun and Nai-Qi Wu. Cycle Time Analysis for Wafer Revisiting Process in Scheduling of Single-arm Cluster Tools. International Journal of Automation and Computing, vol. 8, no. 4, pp. 437-444, 2011. DOI: 10.1007/s11633-011-0601-5
Citation: Yu-Xi Sun and Nai-Qi Wu. Cycle Time Analysis for Wafer Revisiting Process in Scheduling of Single-arm Cluster Tools. International Journal of Automation and Computing, vol. 8, no. 4, pp. 437-444, 2011. DOI: 10.1007/s11633-011-0601-5

Cycle Time Analysis for Wafer Revisiting Process in Scheduling of Single-arm Cluster Tools

  • Some wafer fabrication processes performed by cluster tools require revisiting. With wafer revisiting, a cluster tool is very difficult to be scheduled due to a large number of possible schedules for the revisiting process. Atomic layer deposition (ALD) is a typical process with wafer revisiting that should be performed by cluster tools. This paper discusses the scheduling problem of single-arm cluster tools for the ALD process. In scheduling such a system, the most difficult part is to schedule the revisiting process such that the cycle time is minimized. Thus, this paper studies the revisiting process of ALD with revisiting times k = 3, 4, and 5, and analytical expressions are obtained to calculate the cycle time for the k possible schedules. Then, the schedule with the minimal cycle time is the optimal one. In this way, the scheduling problem of such a revisiting process becomes very simple and this is a significant improvement in scheduling cluster tools with wafer revisiting. Illustrative example is presented to show the application of the proposed method.
  • loading

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return